NVision 40

Model name:

  • NVison40

Location:

  • HPK D18

Phone:

  • 3 23 47

Price category:

  • FIBSEM

external page Direct booking link to PPMS

Instrument contact

Dr. Joakim Reuteler
Lecturer at the Department of Materials
  • HPM D 47
  • +41 44 633 69 91
  • Email
  • vCard Download

ScopeM
Otto-Stern-Weg 3
8093 Zürich
Switzerland

Brief description:

  • Focused Ion Beam Scanning Electron Microscope (FIB-SEM)

Camera / detectors:

  • SE, inlens SE, inlens EsB, Edax EDX,  

Software:

  • SmartSEM Macro, tomography,  EDAX Genesis, ...

Key features:

  • focused Ga⁺ liquid metal ion source, 0.15 pA to 45 nA current, 1 to 30 kV energy
  • high resolution FEG SEM
  • 5 Kleindiek Micromanipulator Systems
  • Gas injection system (carbon, platinum, insulator, water).

 

Manuals:

  • Zeiss Instrument manual