CS-corrected Microscope
Results Obtained on the Beam-Corrected Hitachi HD 2700 CS
Properties of the Microscope
- Dedicated scanning transmission electron microscope (STEM)
- Cold field emission gun (FEG); acceleration voltage Uacc= 200kV
- external page CEOS external page corrector system for the probe-forming objective lens
Working modes:
- Ultra High Resolution (UHR): beam diameter ≤ 0.1 nm ⇒ resolution < 0.1 nm
- High Resolution (HR): beam diameter ca. 0.2 nm
- Normal: beam diameter ≥ 0.3 nm
Equipment:
- BF and (HA)ADF detectors, secondary electron (SE) detector, external page Gatan Orius
- CCD camera, external page Gatan EEL spectrometer, EDXS detector (external page EDAX)
Description of the microscope:
Performance and Image Analysis of the Aberration-Corrected Hitachi HD-2700C STEM
H. Inada, L. Wu, J. Wall, D. Su, and Y. Zhu, J. Electron Microsc. 58 (2009) 111–122 external page DOI
Imaging with High Resolution
Credits:
Makosch, Van Bokhoven, Baudouin, Copéret
Nano Analysis by EDXS
Credits:
Mondelli, Pérez-Ramírez, Marx, Baiker
Selected Publications
Characterization of Catalysts in an Aberration-Corrected Scanning Transmission Electron Microscope
F. Krumeich, E. Müller, R. A. Wepf, and R. Nesper, J. Phys. Chem. C 2011, 115, 1080–1083 external page DOI
Surface Properties and Morphology of Supported, Colloid-Derived Gold/Palladium Mono- and Bimetallic Nanoparticles
S. Marx, F. Krumeich, and A. Baiker, J. Phys. Chem. C 2011, 115, 8195-8205 external page DOI
Characterization of AuPd Nanoparticles by Probe-Corrected Scanning Transmission Electron Microscopy and X-Ray Absorption Spectroscopy
F. Krumeich, S. Marx, A. Baiker, and R. Nesper, Z. anorg. allg. Chem. 2011, 637, 875–881 external page DOI
Phase-Contrast Imaging in Aberration-Corrected Scanning Transmission Electron Microscopy
F. Krumeich, E. Müller, and R. A. Wepf, Micron 2013, 49, 1-14 external page DOI