CS-corrected Microscope
Results Obtained on the Beam-Corrected Hitachi HD 2700 CS
Properties of the Microscope
- Dedicated scanning transmission electron microscope (STEM)
- Cold field emission gun (FEG); acceleration voltage Uacc= 200kV
- external page CEOS external page corrector system for the probe-forming objective lens
Working modes:
- Ultra High Resolution (UHR): beam diameter ≤ 0.1 nm ⇒ resolution < 0.1 nm
- High Resolution (HR): beam diameter ca. 0.2 nm
- Normal: beam diameter ≥ 0.3 nm
Equipment:
- BF and (HA)ADF detectors, secondary electron (SE) detector, external page Gatan Orius
- CCD camera, external page Gatan EEL spectrometer, EDXS detector (external page EDAX)
Description of the microscope:
Performance and Image Analysis of the Aberration-Corrected Hitachi HD-2700C STEM
H. Inada, L. Wu, J. Wall, D. Su, and Y. Zhu, J. Electron Microsc. 58 (2009) 111–122 DOI
Imaging with High Resolution
Nano Analysis by EDXS
Selected Publications
Characterization of Catalysts in an Aberration-Corrected Scanning Transmission Electron Microscope
F. Krumeich, E. Müller, R. A. Wepf, and R. Nesper, J. Phys. Chem. C 2011, 115, 1080–1083 external page DOI
Surface Properties and Morphology of Supported, Colloid-Derived Gold/Palladium Mono- and Bimetallic Nanoparticles
S. Marx, F. Krumeich, and A. Baiker, J. Phys. Chem. C 2011, 115, 8195-8205 external page DOI
Characterization of AuPd Nanoparticles by Probe-Corrected Scanning Transmission Electron Microscopy and X-Ray Absorption Spectroscopy
F. Krumeich, S. Marx, A. Baiker, and R. Nesper, Z. anorg. allg. Chem. 2011, 637, 875–881 external page DOI
Phase-Contrast Imaging in Aberration-Corrected Scanning Transmission Electron Microscopy
F. Krumeich, E. Müller, and R. A. Wepf, Micron 2013, 49, 1-14 external page DOI