Literature
Selected Literature about Electron Microscopy
Books
Analytical Transmission Electron Microscopy - An Introduction for Operators
J. Thomas, T. Gemming, Springer, Berlin, 2014
Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker
J. Thomas, T. Gemming, Springer, Berlin, 2014
A well written treatment of TEM and analytical methods on a student's level. The book is - as claimed in its title - a very suitable introduction for TEM beginners discussing important practical aspects and explaining the necessary theory mostly in a qualitative way.
Transmission Electron Microscopy
D. B. Williams and C. B. Carter, Plenum Press, New York, 1996
Covers all TEM methods, including analytical electron microscopy and electron diffraction. Gives only the basic theory but many hints for practical work. Most useful and highly recommended!
High-Resolution Transmission Electron Microscopy and Associated Techniques
Ed. Buseck, Cowley and Eyring, Oxford University Press, 1988
Many examples from solid state chemistry and materials science.
High-Resolution Electron Microscopy
J. C. H. Spence, Oxford University Press, 3rd Ed., 2003
Comprehensive treatment of HRTEM and related techniques.
Transmission Electron Microscopy
L. Reimer and H. Kohl, Springer, 5th Ed., Berlin, 2007
Revised version of "The Reimer". Comprehensive treatment of theory. For specialists!
Scanning Electron Microscopy and X-Ray Microanalysis
J. Goldstein, D. Newbury, D. Joy, C. Lyman, P. Echlin, E. Lifshin, L. Sawyer, J. Michael
Kluwer Academics/ Plenum Publishers, 3rd Ed., New York, 2003
Comprehensive treatment.
Aberration-Corrected Imaging in Transmission Electron Microscopy
R. Erni, Imperial College Press, 2nd Ed., London, 2015
Very useful introduction into aberration-corrected HRTEM and STEM.
Aberration-Corrected Analytical Transmission Electron Microscopy
R. Brydson (Ed.), John Wiley and Sons, Ltd., Chichester, 2011
Well written introduction into probe-corrected STEM and its applications.
Scanning Transmission Electron Microscopy
S. J. Pennycook, P. D. Nellist (Eds.), Springer, New York, 2011
Comprehensive introduction into probe-corrected STEM including a detailed view on the history of STEM. Many examples of applications in various fields are given by specialists.
Reviews about Electron Microscopy Methods and their Applications in Solid State Chemistry and Nano Science
High-Resolution Transmission Electron Microscopy
Hochauflösende Durchstrahlungs-Elektronenmikroskopie
R. Gruehn and R. Ross, Chemie in unserer Zeit 21 (1987) 194-206 external page DOI
Is Science Prepared for Atomic Resolution Electron Microscopy?
K. W. Urban, Nature Mater. 8 (2009) 260-262 external page DOI
Historical Aspects of Aberration Correction
H. Rose, J. Electron Microsc. 58 (2009) 77–85 external page DOI
Negative Spherical Aberration Ultrahigh-Resolution Imaging in Corrected Transmission Electron Microscopy
K. W. Urban, C. Jia, L. Houben, M. Lentzen, S. Mi and K. Tillmann, Phil. Trans. R. Soc. A 367 (2009) 3735–3753 external page DOI
Transmission Electron Microscopy
F. Krumeich, in: Handbook of Solid State Chemistry, Vol. 3: Characterization (Eds. R. Dronskowski, S. Kikkawa, A. Stein), Wiley (Weinheim) 2017, 155-182, external page DOI
Analytical Electron Microscopy
Quantitative Energy-Filtering Transmission Electron Microscopy in Material Science
W. Grogger, F. Hofer, P. Warbichler, and G. Kothleitner, Microsc. Microanal. 6 (2000) 161-172 external page DOI
Analytical Transmission Electron Microscopy
W. Sigle, Annu. Rev. Mater. Res. 35 (2005) 239-314 external page DOI
Electron Energy-Loss Spectroscopy in the TEM
R. F. Egerton, Rep. Prog. Phys. 72 (2009) 016502 (25pp) external page DOI
Electron Diffraction
Crystallography in the Conventional Electron Microscope: Moving Between Direct and Reciprocal Space
S. Amelinckx, Acta Cryst. B 51 (1995) 486-501 external page DOI
Microdiffraction as a Tool for Crystal Structure Identification and Determination
J. P. Morniroli and J. W. Steeds, Ultramicroscopy 45 (1992) 219-239 external page DOI
Scanning Transmission Electron Microscopy
Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope
M. Varela, A. R. Lupini, K. van Benthen, A. Y. Borisevich, M. F. Chrisholm, N. Shibata, E. Abe, and S. J. Pennycook, Annu. Rev. Mater. Res. 35 (2005) 539-569 external page DOI
Aberration-Corrected Scanning Transmission Electron Microscopy: from Atomic Imaging and Analysis to Solving Energy Problems
S. J. Pennycook, M. F. Chisholm, A. R. Lupini, M. Varela, A. Y. Borisevich, M. P. Oxley, W. D. Luo, K. Van Benthem, S.-H. Oh, D. L. Sales, S. I. Molina, J. Garcia-Barriocanal, C. Leon, J. Santamaria, S. N. Rashkeev and S. T. Pantelides, Phil. Trans. R. Soc. A 367 (2009) 3709–3733 external page DOI
EM in Material Science
New Developments in Transmission Electron Microscopy for Nanotechnology
Z. L. Wang, Adv. Mater. 15 (2003) 1497-1514 external page DOI
High-Resolution Transmission Electron Microscopy: the Ultimate Nanoanalytical Technique
J. Meurig Thomas and P. A. Midgley, Chem. Commun. (2004) 1253-1267 external page DOI
Advanced Electron Microscopy Characterization of Nanostructured Heterogeneous Catalysts
J. Liu, Microsc. Microanal. 10 (2004) 55-76 external page DOI
HRTEM in Solid State Chemistry
High-Resolution Electron Microscopy Reexamined as a Tool in Solid State Chemistry
R. Gruehn and W. Mertin, Angw. Chem. Int. Ed. 19 (1980) 505-520 external page DOI
High-Resolution Electron Microscopy in Solid State Chemistry
L. Kihlborg, Prog. Solid State Chem. 20 (1990) 101-133 external page DOI
Advanced Electron Microscopy and its Possibilities to Solve Complex Structures: Application to Transition Metal Oxides
G. Van Tendeloo, J. Hadermann, A. M. Abakumov and E. V. Antipov, J. Mater. Chem. 19 (2009) 2660–2670 external page DOI