Transmission Electron Microscopy (TEM)
Utilized signals: elastically scattered electrons - direct beam and diffracted beams.
A main advantageous characteristic of a transmission electron microscope is the possibility to obtain information in real space (imaging mode) and reciprocal space (diffraction mode) almost simultaneously.
An introduction into the function principles of a TEM with animations can be found on Goodhew's Matter page and into theory and practice of TEM on the web site of Rodenburg.
The potential of HRTEM in combination with electron diffraction for structure determination is demonstrated on example of a new Zr/Nb/W oxide.